Authors: T. Frederiksen, C. Munuera, C. Ocal, M. Brandbyge, M. Paulsson, D. Sanchez-Portal and A. Arnau
Research Areas:
Scanning Probe Microscopy, Self-Assembly/Patterning/Lithography,
Journal: ACS Nano
Year: 2009
Keywords: conductive force microscope
Posted On: July 28, 2009 Posted By: admin
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